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The microelectronics FA event of the year is in Dallas, Texas USAPlan now to attend ISTFA 2010.
Conference: November 14-18, 2010
InterContinental Hotel Dallas Enrich your career at the 36th International Symposium for Testing and Failure Analysis, November 14-18 in Dallas, Texas. Acquire the latest knowledge from the field's leading professionals with six days of tutorials, short courses, technical presentations, panels, and user groups. Research leading edge instruments and solutions at the industry's largest dedicated equipment expo. Meet and network with hundreds of your peers from novice to expert.
EDFAS 2010 Photo Contest
OPEN TO ALL MEMBERS OF THE FAILURE ANALYSIS COMMUNITY! Share your best images with the failure analysis community and be recognized for creating them!For more information, click here LOOKING TO BE PUBLISHED ! EDFAS is currently seeking articles for a peer reviewed journal dedicated to microsystems failure analysis. If you are interested in knowing more about the journal article submission process please contact Jeremy Walraven for further information. |
A special thank you Official Media Sponsor: |
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