• Receive Electronic Device Failure Analysis, the official magazine of the society. A resource for technical information developments in microelectronic failure analysis industry. EDFA provides insight and trends in failure analysis, reviews of lab facilities, new product announcements, recognition of outstanding contributions in the field of failure analysis and the news of the society.
  
  
• Participate in the email discussion list-- a great way to network and exchange ideas with others in the field of electronic failure analysis. (All EDFAS members are automatically subscribed to the email discussion list.)
  
  
• Save when registering for the annual event of the society, The International Symposium on Testing and Failure Analysis (ISTFA), the premier conference for advanced failure analysis techniques and tools for microelectronic applications. This unique forum is comprised of a technical conference and educational seminars organized by experts in the field of testing and failure analysis.
  
  
• Obtain "members-only" discounts on ASM publications and have the opportunity to publish your own technical works.

• Email the EDFAS Golden Gate Chapter 
• EDFAS Lonestar Chapter

View EDFAS Benefits brochure (pdf format)

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